Abstract: This study aims to explore the solder fatigue lifetime of a developed high-voltage (1.7 kV/100 A) SiC power MOSFET module for on-board chargers (OBCs) subjected to power cycling test (PCT) ...
Abstract: The domain gap in neural networks has been a major problem limiting the efficacy of real-world applications. Attempts have been made in much research to close the domain gap using a few ...
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