For decades, process and design scaling has triggered the adoption of transformative test solutions. About twenty years ago, when at-speed test became a de-facto requirement, on-chip compression ...

IC designers now have a powerful weapon in the struggle against rising test costs: commercially available EDA solutions that provide fast and effective means to implement scan compression on-chip. By ...

Boundary scan has traditionally been difficult to promote as a product-design requirement. But boundary-scan success stories have percolated into the electronic-design community, and the availability ...