Abstract: As CMOS technology continues to scale, the associated reduction in device reliability margins has made accurate reliability evaluation a critical component of digital circuit design.
Adam Hayes, Ph.D., CFA, is a financial writer with 15+ years Wall Street experience as a derivatives trader. Besides his extensive derivative trading expertise, Adam is an expert in economics and ...
Abstract: This article explores the modeling of inter-turn short circuits (ITSCs) in segmented permanent magnet synchronous machines, with a focus on highly coupled segmentation (HCS) and multisector ...
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