Abstract: In this study, we investigate and model gate-induced-drain-leakage (GIDL) in fully depleted silicon-on-insulator (FDSOI) MOSFETs under low electric fields. Traditional FDSOI SPICE models ...
Abstract: Low-light image enhancement (LLIE) aims to improve the illuminance of images due to insufficient light exposure. Recently, various lightweight learning-based LLIE methods have been proposed ...
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