Abstract: In this letter, we present clear experimental evidence proving that a high-temperature idle/data-retention phase gives rise to a permanent intensification of random telegraph noise (RTN) in ...
Abstract: Fast downscaling of technology features in CMOS fabrication processes have resulted in numerous insurmountable challenges, which prompted researchers to explore alternative storage and ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback