Parallel test is a surefire method for speeding up production, and asynchronous parallel test has long been known as an effective way of significantly improving through-put while making the most of ...

The foundation of parametric test within semiconductor manufacturing is its usefulness in determining that wafers have been fabricated properly. Foundries use parametric test results to help verify ...

PARAMETRIC Insurance offers a modern approach to risk management by providing insurance coverage based on specific factors rather than complex evaluations. Unlike traditional insurance that relies on ...

Climate change is roiling the insurance industry, boosting demand for AI-focused, event-based parametric plans like Arbol's $10 million reinsurance claim.

No part of a product life cycle is immune to time-to-market pressures, and that includes wafer-level parametric tests on scribe-line test structures.

System compatibility and data correlation with Keysight 4080 series parametric tester, enables customers to utilize their existing tester programs, test plans and probe cards with 4080-compatible ...

Several new tests are proposed for examining the adequacy of a family of parametric models against large nonparametric alternatives. These tests formally check if the bias vector of residuals from ...