Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...
A methodology to create efficient manufacturing mixed-signal tests that reduce both test costs and test escapes.
At $399,000, the 93000 SoC (system-on-a-chip) DFT (design for test) series promises users a one-cent-per-second cost of test. As such, this version of the Agilent Technologies 93000 SoC platform would ...
To meet the increasing size of ICs, required to accommodate the integration of billions of transistors in order to deliver the performance required for tasks such as AI and autonomous vehicles, Mentor ...
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