For more than four decades, scan technology has somehow eluded the radar screen of the IC test industry. As test continues to evolve and make significant newsworthy changes, scan has maintained a ...
Today, PCBs are becoming more and more complex, and that means adequate test coverage is becoming harder and harder to achieve. Moreover, every test methodology has its limitations. As a result, many ...
Both scan automated test pattern generation (ATPG) patterns and IJTAG patterns 1,2,3 are created for a piece of logic that is part of a much larger design. For both, the patterns are independent from ...
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