Atomic force microscopy (AFM) is a very popular analysis tool for 3D surface topology visualization and other measurements on a wide range of materials at nanoscales ...

As a surface-sensitive technique, the diffraction signal comes from the top few nanometers of the crystal lattice in EBSD. Hence, the top layer needs to be devoid of oxidation, contamination and ...

To produce high-quality cement, the mineralogical and chemical composition of raw materials, as well as of intermediate and finished products, needs to be determined. At each stage of the production ...

This article examines the use of femtosecond (fs) laser ablation for site-specific TEM sample preparation in a FIB-SEM. Various workflows are shown facilitating TEM lamella preparation of regions of ...