The IDDQ test relies on measuring the supply current (I DD) of an IC’s quiescent state, when the circuit isn’t switching and inputs are held at static values. Test patterns are used to place the ...

The electronics industry is in the midst of a transformation that is drastically changing product design and manufacture. Deep submicron process technology puts more gates on a chip, and the ...

A power system functions normally until after the occurrence of a fault in the system. The good news is fault events can be minimized or avoided through diligent electrical design, accurate record ...

ATPG targets faults at IC-gate boundaries, but 50% of defects are located within cells. Learn how cell-aware ATPG and user-defined fault models help to ferret out these hard-to-squash bugs.

With the rapid growth in semiconductor content in today’s vehicles, IC designers need to improve their process of meeting functional safety requirements defined by the ISO 26262 standard. The ISO ...