The DataBlaster JT 37×7 rack-mounted instrument (RMI) lets users combine boundary-scan test with functional validation. The RMI supports all boundary-scan test applications, including IEEE 1149.6 ...
The approach to high-end aerospace/defense test system development is shifting from application-specific systems to common core automated systems to reduce overall cost and increase flexibility.
My first job after leaving school was that of an associate engineer. This meant that I was half technician and half engineer, and I would design something and then build and test it. Because of this ...
Leverage Functional Interfaces For High-Speed Test Access During All Phases Of The Silicon Lifecycle
Chip testing used to be straightforward. The development team used fault simulation to select a subset of the functional tests that could detect most possible manufacturing faults. These were ...
With the rapid growth in semiconductor content in today’s vehicles, IC designers need to improve their process of meeting functional safety requirements defined by the ISO 26262 standard. The ISO ...
Decades of advances in the semiconductor industry continue to drive an insatiable consumer demand for smaller, more powerful, more ubiquitous semiconductor devices—whether in our cars, within our ...
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